Leica DCM 3D
Non-Contact Measuring Microscope
Overview
Confocal and interferometry techniques
Leica Microsystems in cooperation with Sensofar is presenting a new complete solution able to outperforms all existing systems due to its unique combination of techniques. The DCM 3D is the first dual core 3D measuring microscope which combines both confocal and interferometry techniques the first time together. In addition to its compact and robust design, the DCM 3D is a complete tool that is ideal for obtaining a super fast, non-invasive assessment of the micro- and nano-geometry of technical surfaces, in multiple configurations.
Dual Core Technology
The only system combining confocal and interferometry technology. Widest range of applications: vertical resolution from 0.1 nm to 10 mm and high speed measurements
New MD Confocal Microscope
New patented Micro Display Confocal Technology Measuring all kind of materials allows to have confocal image and bright field image of the same area simultaneously
Widest range of magnifications and NA and working distance
Able to measure up to 70 slopes on polished surfaces benefits in the flexibility to have all in one instrument
PSI & VSI
Measuring super-smooth surfaces with sub-nanometer resolution allows high precision measurements
Leica High Quality Optics
One optic for interferometry and confocal technique
Unique and proprietary high contrast algorithms
Highest optical sectioning capability offers the highest vertical resolution achieved with a confocal profiler
Special Leica Interferential Optics
- Variable reflectance, tip-tilt and reference mirror focusing incorporated offers
- No need to tilt the sample
- No limit in sample size
- From extremely low to 100% reflectivity surfaces
